Infrastructure @ ALPS

Applied research and development needs people, ideas and equipment.

Need more detailed information on availability of specific equipment ? 
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Equipment for surface characterisation

new!!!  Ellipsometer

  • Reflectometer FILMETRICS F20-UV for optical coating thickness measurement and determination of refractive index of dielectrical thin coatings, for coating thicknesses between 1nm and 70µm, spectral range; 200-1100nm
  • confocal microscopy; SENSOFAR, Neox

Mechanical properties

  • Universal testing machine Zwick (1 kN - 200 kN) with contact-type extensometer for tensile, compression and flexure tests
  • Small tensile testing machine zwicki (1 N - 2500 N)
  • Impact testing machine 300J (Charpy impact test)
  • Universal hardness tester Gnehm SM600 (Brinell, Vickers, Rockwell-C hardness)
  • Low-load Vickers hardness tester Future Tech FM-300
  • Indentation hardness tester Fischerscope HM2000 (loads from 4 to 2000 mN, Nanoindentation)
  • 100kN universal testing machine
  • 50J impact testing machine
  • hardness tester (HV, HRC)
  • low load hardness tester (HV)

Metallurgical studies


  • Carbon/Sulphur analyser Horiba EMIA-320V
  • Nitrogen/Hydrogen combustion analyser Bruker Galileo G8 N/H
  • Dew point measurement instrument
  • Leak detector (He and Hydrogen)
  • Reflected-light microscope Nikon Eclipse LV150A (max. magnification 1000x) with image analysis software
  • Stereoscopic zoom microscope Nikon SMZ1500 (max. magnification 112x)

Glow discharge spectrometry GDOES

  • Equipment for preparation and etching of metallographic specimens (including electro-polishing and -etching) :
  • Ripper: Struers Discotom-2
  • Mounting press: Struers LaboPress-3 (Ø30mm)
  • Modular grinding machine: Struers LaboPol
  • Standard grinding and polishing machine: Presi P230
  • Advanced grinding and polishing machine: Struers Tegramin
  • Electric polisher: LectroPol-5 

Process control and diagnosis

High Speed ICCD camera  (10 ns) 

Acquisition and control electronics

  • High resolution spectroscopy (8 pm)